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The qualification/tied_array_channelised_voltage/test_gain test occasionally shows a difference one greater expected for a single value in the test every now and then. It's very intermittent. To a first approximation this shouldn't be possible because the tolerance for each test should be taken into account and there's no way for dithering to cause a bigger difference assuming that the incoming signal is the same.
We think that this is caused by separate dithering for each pol in the F-engine which means that despite having the same d-sim input, the F-engine output for pol0 and pol1 may be ever so slightly different from each other, just different to cause the error.
In this commit I adjust the test to using the same pol in three different beams for comparison, rather than three half-beams which would have been pol0, pol1, pol0.
This appears to solve the problem.
Closes NGC-1473.
Checklist (if not applicable, edit to add
(N/A)
and mark as done):setup.cfg
and.pre-commit-config.yaml
sphinx-apidoc -efo doc/ src/
to update files indoc/
fake_servers.py
in katsdpcontroller to match